By Gordon Roberts, Friedrich Taenzler, Mark Burns
Built-in circuits incorporating either electronic and analog features became more and more conventional within the semiconductor undefined. Mixed-signal IC try and dimension has grown right into a hugely really expert box of electric engineering. even though, attempt engineering continues to be a comparatively unknown occupation in comparison to IC layout engineering. It has turn into tougher to rent and educate new engineers to develop into expert mixed-signal try out engineers. The sluggish studying curve for mixed-signal try engineers is essentially a result of scarcity of written fabrics and university-level classes near to mixed-signal trying out. whereas many textbooks were dedicated to the topic of electronic try out and testability, an identical can't be stated for analog and mixed-signal computerized try out and measurement.An advent to Mixed-Signal IC attempt and dimension is a textbook for complex undergraduate and graduate-level scholars in addition to engineering execs. It used to be written in accordance with the dearth of simple path fabric for mixed-signal attempt and size. The publication assumes a superb historical past in analog and electronic circuits in addition to a operating wisdom of desktops and laptop programming. A heritage in electronic sign processing and statistical research can be invaluable, even though now not completely necessary.This textual content encompasses the checking out of either analog and mixed-signal circuits together with many borderline examples. electronic checking out is roofed, yet now not as commonly as a result of the wealth of knowledge in this subject already to be had. Examples and illustrations utilizing state of the art commercial know-how improve and brighten up the presentation all through. In contemplating the functions of this know-how, the trying out of large-scale mixed-signal circuits and person circuits is brought. The value-added merits of mixed-signal IC checking out to a manufacturer's product are in actual fact mentioned, and the function of the try out engineer is obviously outlined.
Read Online or Download An Introduction to Mixed-Signal IC Test and Measurement PDF
Similar circuits books
Designed to supply an intensive knowing of design's primary ideas with out requiring scholars to memorize loads of very likely complicated technological information. DLC: built-in circuits - layout - information processing.
This e-book brings jointly 5 issues at the program of Boolean features. they're 1. Equivalence periods of Boolean services: The variety of n-variable capabilities is big, even for values as small as n = 6, and there was a lot examine on classifying services. there are numerous classifications, each one with their very own certain advantage.
Energy distribution networks (PDNs) are key elements in modern-day high-performance digital circuitry. They make sure that circuits have a relentless, solid provide of strength. The complexities of designing PDNs were dramatically diminished by way of frequency-domain research. This publication examines step by step how electric engineers can use frequency-domain thoughts to thoroughly simulate, degree, and version PDNs.
Electric overstress (EOS) and Electrostatic discharge (ESD) pose probably the most dominant threats to built-in circuits (ICs). those reliability matters have gotten extra severe with the downward scaling of equipment characteristic sizes. Modeling of electric Overstress inIntegrated Circuits provides a complete research of EOS/ESD-related disasters in I/O safety units in built-in circuits.
- Analog-Digital Conversion
- Multi-Chip Module Test Strategies
- Handbook of Electronics Formulas, Symbols and Definitions
- Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films, Volume 162
Extra info for An Introduction to Mixed-Signal IC Test and Measurement
Overview of Mixed-Signal Testing 19 severalcompanieshave marketed test sockets that reduce these problems, a socketed device will often not perform quite as well as a device soldered directly to a printed circuit board. Performancedifferences due to sockets are yet another potential source of correlation error and extendedtime to market. 4 Economics of Production Testing Time is money, especially when it comes to production test programs. A high-performance tester may cost two million dollars or more, depending on its configuration.
Concurrentengineeringprojectflow The flow begins with a definition of the device requirements. These include product features, electrical specifications, power consumption requirements, die area estimates, etc. Once the device requirements are understood, the design team begins to design the individual circuits. In the initial design meetings, test and product engineers work with the design engineers to define the testability features that will make the device less expensive to test and manufacture.
For this reason it is important to know which organization is responsible for controlling the data sheet's contents. Therearetwo kinds of devices:catalogandcustom. A catalogdeviceis onethat is definedby the semiconductor manufactureror by an IC designhouse. Oncedefmed,a catalog 23 24 An Introductionto Mixed-Sigi,alIC Testand Measurement deviceis offeredto multiple customersfor use in their end applications. It mustmeetthat customer'sexactrequirements. The test engineer only needsto get agreementfrom the design and systems engineers to make a data sheet change.
An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns